The di/dt values (when scaled up) are close to the maximum design specs for the IR 15/RA100 SCR's used. This is a problem which was later confirmed when accelerator tests were done at higher voltages. A number of failures occurred where the SCR's fused in a dead short across the recharge capacitor bank. This was due to excessive di/dt and thermal shock within the silicon wafer. A higher voltage (2200V) and higher amperage flat pac SCR would have made the recharge system useble at full voltage (full power). Table 4.6 Recharge system circuit energies Table 4.7 Recharge system circuit parameters
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